Specifications
Lateral Resolution (xy)
Down to 1 μm (standoff-dependent)
Depth Resolution (z)
Down to 0.5 μm (~10% distance to sensor)
Field of View
Up to 3 mm x 3 mm, automatic stitching up to 5 cm x 5 cm
Noise Floor
150 nT (DC)
Defect Types
Package and die: shorts (wide range), leakages, opens
Detection Capability
Open & Short Circuits
Sensitivity
<10 μT/√Hz
Typical Measurement Time
5-10 minutes
Requirements
Voltage / Power
230 V (single phase) / 16 A
Mechanical Stability
Optical table with suspension, stabilised sample region
Operating Temperature
15 - 40 °C
Environment
Ambient conditions (Room temperature and pressure)
QD Webinar
Below is a detailed overview of the QDM capabilities, as well as how the technology works.
QD Software
Below is a detailed overview of the capabilities of QD's software, as well as an understanding of the UX/UI.
Product visuals
QDm.1: The Flagship Quantum Diamond Microscope for Failure Analysis
The QDm.1 is a powerful tool for imaging electrical activity in circuits, isolating short and open failures non-destructively.
user manual
The QDm.1 enables unprecedented testing capabilities
With the our newest tool iteration, testing got even easier and precise.
Placement of a DUT near the objective, and micropositioners on the stage.
Placement of the quantum diamond sensor on the DUT with the help of a tweezer.
Stage movement upwards to focus on the quantum diamond sensor for measurements.
Contacting the DUT with micropositioners.
Alignment of microwave antenna on top of the sample for driving the NV centers in the quantum diamond sensor.
Showcase of the 6-axis high accuracy, high precision hexapod stage.