QDm.1: The Flagship Quantum Diamond Microscope for Failure Analysis
The QDm.1 is a powerful tool for imaging electrical activity in circuits, isolating short and open failures non-destructively.
Native QD software, designed for failure analysis engineers.
Our unique software interface puts advanced quantum sensing at your fingertips with an intuitive, powerful UX designed for semiconductor failure analysis and metrology teams.
Auto-calibration and intuitive control
Intuitive measurements with seamless navigation, flexible controls, and smart self-calibration for users of all levels.
Interactive data and annotations
Access all data components simultaneously or
individually. Draw, annotate, mark data freely and export in various data formats.
Overlay and annotations
Overlay your analysis data on different adjacent data such as optical and Infrared images, as well as hotspot data.
Current density reconstruction
Convert your magnetic field data into electrical activity with interactive visualization and cross-section views for deeper, actionable insights.
Large area stitching
5 cm x 5 cm travel range to stitch larger images without sample replacement.
Precise Fault Detection
Open Circuit Detection
Identify broken connections and trace interruptions in integrated circuits with unprecedented 200nm spatial resolution. Locate failures that conventional methods miss.
Short Circuit Analysis
Pinpoint unintended electrical connections and current leakage paths in packaged and unpackaged devices. Fast, non-destructive analysis in under 10 seconds per scan.
Experience QDM First-Hand
Join our exclusive demo program and see the QuantumDiamonds Microscope in action at your facility. Limited availability for qualified semiconductor manufacturers.