QDm.1: The Flagship Quantum Diamond Microscope for Failure Analysis
The QDm.1 is a powerful tool for imaging electrical activity in circuits, isolating short and open failures non-destructively.
Native QD software, designed for failure analysis engineers.
Our unique software interface puts advanced quantum sensing at your fingertips with an intuitive, powerful UX designed for semiconductor failure analysis and metrology teams.
Auto-Calibration and Intuitive Control
Intuitive measurements with seamless navigation, flexible controls, and smart self-calibration for users of all levels.
Interactive Data and Annotations
Access all data components simultaneously or
individually. Draw, annotate, mark data freely and export in various data formats.
Overlay Visualization
Overlay your analysis data on different adjacent data such as optical and Infrared images, as well as hotspot data.
Current Density Reconstruction
Convert your magnetic field data into electrical activity with Machine Learning enhanced 3D interactive visualization and cross-section views for deeper, actionable insights.
Large Area Stitching
5 cm x 5 cm travel range to stitch larger images without sample replacement.
Precise Fault Detection
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In-Lab
Single-chip testing for defect localization
High-resolution, non-destructive localization of defects at the single-chip level for R&D and failure analysis.
In-Fab
Full wafer testing for defect metrology
Full wafer-level localization and characterization of defects directly in the fab environment.
In-Line
Automated wafer mapping for real-time process control
High-throughput wafer mapping for real-time monitoring and optimization of production processes.
Experience QDM First-Hand
Purchase the QDm.1, a powerful tool for imaging electrical activity in circuits and non-destructively isolating short and open failures. Or join our exclusive demo program today to see the system in action at your facility.